Contrastive Uncertainty learning for iris recognition with insufficient labeled samples
Wei Jianze1,2,3; He Ran1,3; Sun Zhenan1,3
2021
会议日期04-07 August 2021
会议地点Shenzhen, China
英文摘要

Cross-database recognition is still an unavoidable challenge when deploying an iris recognition system to a new environment. In the paper, we present a compromise problem that resembles the real-world scenario, named iris recognition with insufficient labeled samples. This new problem aims to improve the recognition performance by utilizing partially-or un-labeled data. To address the problem, we propose Contrastive Uncertainty Learning (CUL) by integrating the merits of uncertainty learning and contrastive self-supervised learning. CUL makes two efforts to learn a discriminative and robust feature representation. On the one hand, CUL explores the uncertain acquisition factors and adopts a probabilistic embedding to represent the iris image. In the probabilistic representation, the identity information and acquisition factors are disentangled into the mean and variance, avoiding the impact of uncertain acquisition factors on the identity information. On the other hand, CUL utilizes probabilistic embeddings to generate virtual positive and negative pairs. Then CUL builds its contrastive loss to group the similar samples closely and push the dissimilar samples apart. The experimental results demonstrate the effectiveness of the proposed CUL for iris recognition with insufficient labeled samples.

语种英语
内容类型会议论文
源URL[http://ir.ia.ac.cn/handle/173211/48620]  
专题自动化研究所_智能感知与计算研究中心
通讯作者Sun Zhenan
作者单位1.National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences
2.School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China
3.Center for Research on Intelligent Perception and Computing, National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences
推荐引用方式
GB/T 7714
Wei Jianze,He Ran,Sun Zhenan. Contrastive Uncertainty learning for iris recognition with insufficient labeled samples[C]. 见:. Shenzhen, China. 04-07 August 2021.
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