A Compact Convolutional Neural Network for Surface Defect Inspection
Huang, Yibin1,3; Qiu, Congying2; Wang, Xiaonan3; Wang, Shijun3; Yuan, Kui3
刊名SENSORS
2020-04-01
卷号20期号:7页码:19
关键词surface defect inspection convolutional neural network machine vision
DOI10.3390/s20071974
通讯作者Wang, Xiaonan(wangxiaonan2012@ia.ac.cn)
英文摘要The advent of convolutional neural networks (CNNs) has accelerated the progress of computer vision from many aspects. However, the majority of the existing CNNs heavily rely on expensive GPUs (graphics processing units). to support large computations. Therefore, CNNs have not been widely used to inspect surface defects in the manufacturing field yet. In this paper, we develop a compact CNN-based model that not only achieves high performance on tiny defect inspection but can be run on low-frequency CPUs (central processing units). Our model consists of a light-weight (LW) bottleneck and a decoder. By a pyramid of lightweight kernels, the LW bottleneck provides rich features with less computational cost. The decoder is also built in a lightweight way, which consists of an atrous spatial pyramid pooling (ASPP) and depthwise separable convolution layers. These lightweight designs reduce the redundant weights and computation greatly. We train our models on groups of surface datasets. The model can successfully classify/segment surface defects with an Intel i3-4010U CPU within 30 ms. Our model obtains similar accuracy with MobileNetV2 while only has less than its 1/3 FLOPs (floating-point operations per second) and 1/8 weights. Our experiments indicate CNNs can be compact and hardware-friendly for future applications in the automated surface inspection (ASI).
资助项目National Key R&D Program of China[2018YFB1306500] ; National Natural Science Foundation of China[61421004]
WOS关键词FEATURE-EXTRACTION
WOS研究方向Chemistry ; Engineering ; Instruments & Instrumentation
语种英语
出版者MDPI
WOS记录号WOS:000537110500170
资助机构National Key R&D Program of China ; National Natural Science Foundation of China
内容类型期刊论文
源URL[http://ir.ia.ac.cn/handle/173211/39640]  
专题自动化研究所_智能制造技术与系统研究中心_智能机器人团队
通讯作者Wang, Xiaonan
作者单位1.95 Zhongguancun East Rd, Beijing 100190, Peoples R China
2.Columbia Univ, Civil Engn & Engn Mech Dept, New York, NY 10024 USA
3.Univ Chinese Acad Sci, Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714
Huang, Yibin,Qiu, Congying,Wang, Xiaonan,et al. A Compact Convolutional Neural Network for Surface Defect Inspection[J]. SENSORS,2020,20(7):19.
APA Huang, Yibin,Qiu, Congying,Wang, Xiaonan,Wang, Shijun,&Yuan, Kui.(2020).A Compact Convolutional Neural Network for Surface Defect Inspection.SENSORS,20(7),19.
MLA Huang, Yibin,et al."A Compact Convolutional Neural Network for Surface Defect Inspection".SENSORS 20.7(2020):19.
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