Development of single-event-effects analysis system at the IMP microbeam facility

doi:10.1016/j.nimb.2017.02.012

	Development of single-event-effects analysis system at the IMP microbeam facility
	Sheng, Lina2 ; Guo, Jinlong1,2 ; Du, Guanghua2 ; Bi, Jinshun 3; Liu, Wenjing 2; Wu, Ruqun 2; Chen, Hao2 ; Wei, Junze 2; Li, Yaning 2; Liu, Xiaojun2
	2017-08
卷号	404
DOI	10.1016/j.nimb.2017.02.012
页码	250-253
英文摘要	Single-event-effects (SEEs) in integrated circuits (ICs) caused by galactic single ions are the major cause of anomalies for a spacecraft. The main strategies to decrease radiation failures for spacecraft are using SEEs less-sensitive devices and design radiation hardened ICs. High energy ion microbeam is one of the powerful tools to obtain spatial information of SEEs in ICs and to guide the radiation hardening design. The microbeam facility in the Institute of Modern Physics (IMP), Chinese Academy of Science (CAS) can meet both the liner energy transfer (LET) and ion range requirements for SEEs simulation experiments on ground. In order to study SEEs characteristics of ICs at this microbeam platform, a SEEs analysis system was developed. This system can target and irradiate ICs with single ions in micrometer-scale accuracy, meanwhile it acquires multi-channel SEE signals and maps the SEE sensitive regions online. A 4-Mbit NOR Flash memory was tested with this system using 2.2 GeV Kr ions, the radiation sensitive peripheral circuit regions for SEEs of 1 to 0 and 0 to 1 upset, multi-bit-upset and single event latchup have been obtained. (C) 2017 Elsevier B.V. All rights reserved.
会议录	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版者	ELSEVIER SCIENCE BV
会议录出版地	PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
语种	英语
资助项目	Ministry of Science and Technology[2012YQ03014204]
WOS研究方向	Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
WOS记录号	WOS:000404709900047
内容类型	会议论文
源URL	[http://119.78.100.186/handle/113462/58069]
专题	近代物理研究所_实验物理中心
通讯作者	Du, Guanghua
作者单位	1.Northwest Normal Univ, Lanzhou, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou, Peoples R China 3.Chinese Acad Sci, Inst Microelect, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Sheng, Lina,Guo, Jinlong,Du, Guanghua,et al. Development of single-event-effects analysis system at the IMP microbeam facility[C]. 见:.