Leakage current estimation of CMOS circuit with stack effect

	Leakage current estimation of CMOS circuit with stack effect
	Xu, YJ ; Luo, ZY ; Li, XW ; Li, LJ ; Hong, XL
刊名	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
	2004-09-01
卷号	19 期号:5 页码:708-717
关键词	computer-aided design leakage current estimation stack effect macromodeling propagation of signal probability
英文摘要	Leakage current of CMOS circuit increases dramatically with the technology scaling down and has become a critical issue of high performance system. Subthreshold, gate and reverse biased junction band-to-band tunneling (BTBT) leakages are considered three main determinants of total leakage current. Up to now, how to accurately estimate leakage current of large-scale circuits within endurable time remains unsolved, even though accurate leakage models have been widely discussed. In this paper, the authors first dip into the stack effect of CMOS technology and propose a new simple gate-level leakage current model. Then, a table-lookup based total leakage current simulator is built up according to the model. To validate the simulator, accurate leakage current is simulated at circuit level using popular simulator HSPICE for comparison. Some further studies such as maximum leakage current estimation, minimum leakage current generation and a high-level average leakage current macromodel are introduced in detail. Experiments on ISCAS85 and ISCAS89 benchmarks demonstrate that the two proposed leakage current estimation methods are very accurate and efficient.
WOS标题词	Science & Technology ; Technology
类目[WOS]	Computer Science, Hardware & Architecture ; Computer Science, Software Engineering
研究领域[WOS]	Computer Science
关键词[WOS]	DEEP-SUBMICROMETER ; ALGORITHMS ; REDUCTION ; POWER
收录类别	SCI
语种	英语
WOS记录号	WOS:000224137200017
公开日期	2015-12-24
内容类型	期刊论文
源URL	[http://ir.ia.ac.cn/handle/173211/9968]
专题	自动化研究所_09年以前成果
作者单位	1.Chinese Acad Sci, Inst Comp Technol, Beijing 100080, Peoples R China 2.Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China 3.Tsing Hua Univ, Dept Comp Sci & Technol, Beijing 100084, Peoples R China 4.Chinese Acad Sci, Inst Automat, Natl ASIC Design Engn Ctr, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Xu, YJ,Luo, ZY,Li, XW,et al. Leakage current estimation of CMOS circuit with stack effect[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2004,19(5):708-717.
APA	Xu, YJ,Luo, ZY,Li, XW,Li, LJ,&Hong, XL.(2004).Leakage current estimation of CMOS circuit with stack effect.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,19(5),708-717.
MLA	Xu, YJ,et al."Leakage current estimation of CMOS circuit with stack effect".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 19.5(2004):708-717.