CORC

浏览/检索结果: 共1条,第1-1条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
BEOL Based RRAM with One Extra-mask for Low Cost, Highly Reliable Embedded Application in 28 nm Node and Beyond 会议论文
作者:  Lv HB(吕杭炳);  Xu XX(许晓欣);  Yuan P(袁鹏);  Dong DN(董大年);  Gong TC(龚天成)
收藏  |  浏览/下载:26/0  |  提交时间:2018/07/26


©版权所有 ©2017 CSpace - Powered by CSpace