CORC

在结果中检索

CORC

浏览/检索结果: 共31条，第1-10条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
Impact of Village Resistance Values on Simulating Results of Flood Routing in Floodplains 其他
2017-01-01
作者:  Zhang, Fengde;  Zhang, Xiaolei
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/05
Impact of Village Resistance Values on Simulating Results of Flood Routing in Floodplains 其他
2017-01-01
作者:  Zhang, Fengde;  Zhang, Xiaolei
收藏  |  浏览/下载：5/0  |  提交时间：2019/12/05
Impact of Village Resistance Values on Simulating Results of Flood Routing in Floodplains 其他
2017-01-01
作者:  Zhang, Fengde;  Zhang, Xiaolei
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/05
A novel shock protection method based on MEMS compliant latching stopper 其他
2016-01-01
Xu, Kaisi; Zhu, Ningli; Zhang, Xianfeng; Su, Weiguo; Zhang, Wei; Hao, Yilong
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
A NOVEL SHOCK PROTECTION METHOD BASED ON MEMS COMPLIANT LATCHING STOPPER 其他
2016-01-01
Xu, Kaisi; Zhu, Ningli; Zhang, Xianfeng; Su, Weiguo; Zhang, Wei; Hao, Yilong
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
Gate Engineering in SOI LDMOS for Device Reliability 其他
2016-01-01
Aanand; Sheu, Gene; Imam, Syed Sarwar; Lu, Shao Wei; Aryadeep, Chirag; Yang, Shao Ming
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03
Impact of gate coupling and misalignment on performance of double-gate organic thin film transistors 其他
2015-01-01
Han, Jingwen; Sun, Lei; Xu, Hao; Zhang, Yibo; Zhang, Shengdong; Wang, Yi
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/04
Cationic polymerization ultraviolet curing method for preparing epoxy resin encapsulation of solar cell: Used for portable photovoltaic devices 其他
2014-01-01
Mengdi, Dong; Biao, Yang; Bo, You; Yandan, Lin; Yaojie, Sun; Zhong, Zhuang
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Cationic Polymerization Ultraviolet Curing Method for Preparing Epoxy Resin Encapsulation of Solar Cell: Used for Portable Photovoltaic Devices 其他
2014-01-01
Dong Mengdi; Yang Biao; You Bo; Lin Yandan; Sun Yaojie; Zhuang Zhong
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03

©版权所有 ©2017 CSpace - Powered by CSpace