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New Concepts to fabricate semiconductor quantum wireand quantum dot structures
期刊论文
出版物, 3111, 期号: 0, 页码: 201-212
作者:
Klaus H. Ploog
;
Richard
收藏
  |  
浏览/下载:93/0
  |  
提交时间:2017/07/21
TA-denseNet: Efficient hardware trust and assurance model based on feature extraction and comparison of SEM images and GDSII images
期刊论文
INTEGRATION-THE VLSI JOURNAL, 2024, 卷号: 95, 页码: 9
作者:
Xiao, Wei
;
Zhao, Fazhan
;
Zhao, Kun
;
Ma, Hongtu
;
Li, Qing
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2024/02/20
Scanning electron microscopy
Deep learning
Hardware trust and assurance
Integrated circuit
Insights into scratching force in axial ultrasonic vibration-assisted single grain scratching
期刊论文
JOURNAL OF MANUFACTURING PROCESSES, 2024, 卷号: 112, 页码: 150-160
作者:
Zhang, Yuqiang
;
Hu, Zhongwei
;
Chen, Yue
;
Yu, Yiqing
;
Jin, Jianfeng
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2024/04/02
Axial ultrasonic vibration
Scratching
Scratching force
Molecular dynamics
Periodic fluctuation
Development of space-resolved EUV spectrometers working at 5-138 Å for profile observation of high-Z impurity ions in EAST plasma
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2023, 卷号: 1057
作者:
Cheng, Yunxin
;
Zhang, Ling
;
Morita, Shigeru
;
Hu, Ailan
;
Xu, Zong
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2023/11/17
EAST tokamak
Impurity diagnostics
Extreme ultraviolet (EUV) spectrometer
CMOS detector
Influence of neutron irradiation on X-ray diffraction, Raman spectrum and photoluminescence from pyrolytic and hot-pressed hexagonal boron nitride
期刊论文
JOURNAL OF LUMINESCENCE, 2023, 卷号: 263
作者:
Zhou, Shun
;
Xu, Wen
;
Xiao, Yiming
;
Xiao, Huan
;
Zhang, Jing
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2023/11/10
Hexagonal boron nitride
Neutron irradiation
X-ray diffRaction
Raman spectrum
Photoluminescence
Structural and electronic properties of Ta
2
O
5
with one formula unit
期刊论文
COMPUTATIONAL MATERIALS SCIENCE, 2023, 卷号: 230
作者:
Tong, Yangwu
;
Tang, Huimin
;
Yang, Yong
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  |  
浏览/下载:61/0
  |  
提交时间:2023/11/17
Ta2O5
Structure Search
Elementary Building Block
DFT Calculations
Stable Red Light-Emitting Devices Based onCd:CsMnBr
3
With High Photoluminescence Quantum Yield via Cd Incorporation
期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 页码: 6
作者:
Ma, Yibo
;
Zhang, Xiaodong
;
Qiu, Haiyu
;
Guo, Jing
;
Tian, Chuan
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2023/12/12
CsMnBr3
light-emitting diode (LED)
perovskite
semiconductor
Photoelectrochemical effect of Cu 2 O on the corrosion behavior of Cu in sodium sulfate solution
期刊论文
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2023, 卷号: 160, 页码: 46-54
作者:
Li, Jiarun
;
Qian, Feng
;
Guo, Chongqing
;
Wang, Ning
;
Chen, Zhuoyuan
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2023/12/13
Photoinduced corrosion
Copper
SVET
P -type semiconductor
Defect Emission and Its Dipole Orientation in Layered Ternary Znln
2
S
4
Semiconductor
期刊论文
SMALL, 2023
作者:
Wang, Rui
;
Liu, Quan
;
Dai, Sheng
;
Liu, Chao-Ming
;
Liu, Yue
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2023/11/17
back focal plane imaging
defect
dipole orientation
photoluminescence
Znln(2)S(4)
Simulation study on single-event burnout in field-plated Ga2O3 MOSFETs
期刊论文
MICROELECTRONICS RELIABILITY, 2023, 卷号: 149
作者:
Yu, Cheng-hao
;
Guo, Hao-min
;
Liu, Yan
;
Wu, Xiao-dong
;
Zhang, Li-long
收藏
  |  
浏览/下载:11/0
  |  
提交时间:2023/11/10
Depletion-mode
Single-event burnout (SEB)
Single-event gate rupture
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