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科研机构
安徽大学 [12]
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期刊论文 [12]
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2017 [2]
2015 [2]
2014 [1]
2013 [3]
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专题:安徽大学
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Modulation of Band Offset in Sputtering-Derived MoS2/HfO2 Heterojunction by Gd Incorporation
期刊论文
Science of Advanced Materials, 2017, 卷号: Vol.9 No.6, 页码: 1057-1063
作者:
Lv,J. G.
;
Li,W. D.
;
Jin,P.
;
Xiao,D. Q.
;
Zheng,C. Y.
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/04/22
TRANSITION-METAL DICHALCOGENIDES
RAY PHOTOELECTRON-SPECTROSCOPY
CHEMICAL-VAPOR-DEPOSITION
MOS2 ATOMIC LAYERS
MONOLAYER MOS2
TRANSISTORS
ELECTRONICS
ALIGNMENTS
CIRCUITS
GROWTH
Interface chemistry and electronic structure of ALD-derived HfAlO/Ge gate stacks revealed by X-ray photoelectron spectroscopy
期刊论文
Journal of Alloys and Compounds, 2017, 卷号: Vol.716, 页码: 1-6
作者:
Liu,Yanmei
;
Sun,Zhaoqi
;
Jiang,Shanshan
;
Li,Jing
;
Liu,Mao
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/24
ATOMIC-LAYER-DEPOSITION
DIELECTRICS
AL2O3
HFO2
Band offsets in HfTiO/InGaZnO4 heterojunction determined by X-ray photoelectron spectroscopy
期刊论文
Journal of Alloys and Compounds, 2015, 卷号: Vol.642, 页码: 172-176
作者:
J.G. Lv
;
X.F. Chen
;
Z.Q. Sun
;
Y.M. Liu
;
K.R. Zhu
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/22
Band
offset
HfTiO/InGaZnO
heterojunction
X-ray
photoelectron
spectroscopy
Thin
film
transistors
Modification of band offsets of InGaZnO4/Si heterojunction through nitrogenation treatment
期刊论文
Journal of Alloys and Compounds, 2015, 卷号: Vol.647, 页码: 1035-1039
作者:
J.G. Lv
;
X.F. Chen
;
Z.Q. Sun
;
P.H. Wang
;
X.S. Chen
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/24
Band
offset
InGaZnO/Si
heterojunctions
X-ray
photoelectron
spectroscopy
Thin
film
transistors
Interfacial thermal stability and band alignment of Al2O3/HfO2/Al2O3/Si gate stacks grown by atomic layer deposition
期刊论文
Journal of Alloys and Compounds, 2014, 卷号: Vol.591, 页码: 240-246
作者:
Wei,H.H.
;
Sun,Z.Q.
;
Cui,J.B.
;
Zhang,M.
;
Chen,H.S.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/04/24
High-k
gate
dielectrics
Annealing
temperature
X-ray
photoelectron
Spectroscopy
Band
alignment
Interface engineering and chemistry of Hf-based high-k dielectrics on III–V substrates.
期刊论文
Surface Science Reports, 2013, 卷号: Vol.68 No.1, 页码: 68-107
作者:
Sun,Zhaoqi
;
He,Gang
;
Chen,Xiaoshuang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/22
ATOMIC-LAYER-DEPOSITION
FIELD-EFFECT TRANSISTORS
OXIDE-SEMICONDUCTOR CAPACITORS
CHEMICAL-VAPOR-DEPOSITION
MOLECULAR-BEAM EPITAXY
RAY-PHOTOELECTRON-SPECTROSCOPY
PULSED-LASER-DEPOSITION
LIQUID-INJECTION MOCVD
MODE INGAAS MOSFET
SOL-GEL METHOD
Microstructure and Optical Characteristics of Rod-Like Nanoscale CeO2 Synthesized by Hydrothermal Method
期刊论文
Journal of Nanoscience and Nanotechnology, 2013, 卷号: Vol.13 No.10, 页码: 6653-6659
作者:
Meng,Fanming
;
Zhang,Quan
;
Zhang,Cheng
;
Bo,Qianhong
;
Cui,Jingbiao
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/22
RAY PHOTOELECTRON-SPECTROSCOPY
THIN-FILMS
CERIUM OXIDE
RAMAN-SCATTERING
ABSORPTION
GROWTH
SEMICONDUCTORS
NANOPARTICLES
ULTRAVIOLET
REDUCTION
Controllable synthesis and optical properties of nano-CeO2 via a facile hydrothermal route
期刊论文
JOURNAL OF ALLOYS AND COMPOUNDS, JOURNAL OF ALLOYS AND COMPOUNDS, 2013, 卷号: Vol.556, 页码: 102-108
作者:
Wang,Leini
;
Meng,Fanming
;
Cui,Jingbiao
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/24
X-RAY PHOTOELECTRON
THIN-FILMS
ELECTRONIC-STRUCTURE
RAMAN-SCATTERING
CERIUM OXIDE
CEO2
PHOTOLUMINESCENCE
SPECTROSCOPY
SURFACES
Band offsets of epitaxial Tm2O3 high-k dielectric films on Si substrates by X-ray photoelectron spectroscopy
期刊论文
Applied Surface Science, 2012, 卷号: Vol.258 No.16, 页码: 6107-6110
作者:
Zhu,YY
;
Ji,T
;
Wang,JJ
;
Fang,ZB
;
Ren,WY
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/22
ELECTRICAL CHARACTERISTICS
PRECISE DETERMINATION
OXIDES
LU2O3
Effect of annealing temperature on structural, compositional and optical properties of TiO2 films
期刊论文
Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2008, 卷号: Vol.37 No.2, 页码: 411-416
作者:
Song, Xue-Ping
;
Sun, Zhao-Qi
;
Meng, Fan-Ming
;
Zhou, Ming-Fei
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/24
Titanium
dioxide
Annealing
-
Energy
gap
-
Magnetron
sputtering
-
Optical
properties
-
Photoluminescence
-
Structural
properties
-
Thin
films
-
Ultraviolet
visible
spectroscopy
-
X
ray
diffraction
analysis
-
X
ray
photoelectron
spectroscopy
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