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CORC

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A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET 期刊论文
MICROELECTRONICS RELIABILITY, 2008, 卷号: 48, 期号: 4, 页码: 504-507
Dai, MZ; Kim, SI; Yap, A; Liu, SH; Cheng, A; Yi, L
收藏  |  浏览/下载：25/0  |  提交时间：2012/03/24
Modified substrate-current model for high voltage n-channel metal-oxide-semiconductor transistor and its implication on transistor design 期刊论文
APPLIED PHYSICS LETTERS, 2007, 卷号: 91, 期号: 23, 页码: 233504-233504
Dai, MZ; Yap, A; Huang, K; Huang, SY; Wang, J; Wang, S; Jiang, I; Zhang, WJ; Yi, L; Cheng, A; Liu, SH; Liao, KY
收藏  |  浏览/下载：20/0  |  提交时间：2012/03/24
The influence of substrate bias in I-PVD process on the properties of Ti and Al alloy films 期刊论文
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2006, 卷号: 17, 期号: 11, 页码: 931-935
Zhang, WJ; Yi, L; Tao, K; Ma, Y; Chang, PY; Wu, J
收藏  |  浏览/下载：8/0  |  提交时间：2012/03/24
A quick method for AlCu interconnect electromigration performance predicting and monitoring 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 卷号: 21, 期号: 5, 页码: 633-637
Zhang,WJ; Yi,L; Tao,K; Ma,Y; Chang,PY; Mao,DL; Wu,J; Zou,SC
收藏  |  浏览/下载：10/0  |  提交时间：2012/03/24

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