CORC

在结果中检索

CORC

浏览/检索结果: 共18条，第1-10条 帮助

限定条件                
已选(0)清除 条数/页：   排序方式：
Efficient Defect Engineering for Solution Combustion Processed In-Zn-O thin films for high performance transistors 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2017, 卷号: 32, 页码: 095010-095010
作者:  Liang, Xiaoci[1];  Wang, Chengcai[1];  Liang, Jun[2];  Liu, Chuan[1];  Pei, Yanli[1]
收藏  |  浏览/下载：12/0  |  提交时间：2019/04/24
Detection of surface cutting defect on magnet using Fourier image reconstruction (EI收录) 期刊论文
Journal of Central South University, 2016, 卷号: 23, 页码: 1123-1131
作者:  Wang, Fu-liang[1,2];  Zuo, Bo[1,2]
收藏  |  浏览/下载：4/0  |  提交时间：2019/04/24
An improved Otsu method using the weighted object variance for defect detection (EI收录) 期刊论文
Applied Surface Science, 2015, 卷号: 349, 页码: 472-484
作者:  Yuan, Xiao-Cui[1];  Wu, Lu-Shen[1,2];  Peng, Qingjin[1]
收藏  |  浏览/下载：3/0  |  提交时间：2019/04/25
Automated defect detection in textured materials using wavelet-domain hidden Markov models (EI收录) 期刊论文
Optical Engineering, 2014, 卷号: 53
作者:  Hu, Guang-Hua[1];  Zhang, Guo-Hui[1];  Wang, Qing-Hui[1]
收藏  |  浏览/下载：2/0  |  提交时间：2019/04/25
Defect-sensitive crystals based on diaminomaleonitrile-functionalized Schiff base with aggregation-enhanced emission (EI收录) 期刊论文
Journal of Materials Chemistry C, 2013, 卷号: 1, 页码: 7314-7320
作者:  Han, Tianyu[1,2];  Hong, Yuning[1];  Xie, Ni[1];  Chen, Sijie[1];  Zhao, Na[1]
收藏  |  浏览/下载：3/0  |  提交时间：2019/04/25
Semisupervised distance-preserving self-organizing map for machine-defect detection and classification (EI收录) 期刊论文
IEEE Transactions on Instrumentation and Measurement, 2013, 卷号: 62, 页码: 869-879
作者:  Li, Weihua[1];  Zhang, Shaohui[1];  He, Guolin[1]
收藏  |  浏览/下载：2/0  |  提交时间：2019/04/25
Defect-tuning exchange bias of ferromagnet/antiferromagnet core/shell nanoparticles by numerical study (EI收录) 期刊论文
Journal of Physics Condensed Matter, 2012, 卷号: 24
作者:  Mao, Zhongquan[1];  Zhan, Xiaozhi[2];  Chen, Xi[1,2]
收藏  |  浏览/下载：4/0  |  提交时间：2019/04/26
Automatic optical defect inspection and dimension measurement of drill bit (EI收录) 会议论文
2006 IEEE International Conference on Mechatronics and Automation, ICMA 2006, Luoyang, China, June 25, 2006 - June 28, 2006
作者:  Zhang, W.J.[1];  Li, D.[1];  Ye, F.[1];  Sun, H.[1]
收藏  |  浏览/下载：2/0  |  提交时间：2019/04/18
Probabilistic failure assessment of a complex nozzle structure with flaw defect based on FITNET procedure (EI收录) 会议
Vancouver, BC, Canada,
作者:  Wang, Yan[1];  Wang, Yan-Wei[1];  Chen, Hanxin[1];  Ma, Linwei[1]
收藏  |  浏览/下载：9/0  |  提交时间：2019/04/11
TFT-LCD spot-type defect detection in module process (EI收录) 会议论文
Advanced Materials Research, Lijiang, China, May 18, 2014 - May 19, 2014
作者:  Guo, Bo[1];  Hu, Guo Qing[1];  Yang, Guang Yong[1]
收藏  |  浏览/下载：0/0  |  提交时间：2019/04/12

©版权所有 ©2017 CSpace - Powered by CSpace