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Physical understanding of different drain-induced-barrier-lowering variations in high-k/metal gate n-channel metal-oxide-semiconductor-fieldeffect- 期刊论文
Applied physics letters, 2013
作者:  Yang WH(杨文红);  Luo WC(罗维春);  Wang WW(王文武)
收藏  |  浏览/下载:9/0  |  提交时间:2014/10/30


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