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Improved Ti germanosilicidation by Ge pre-amorphization implantation (PAI) for advanced contact technologies 期刊论文
Microelectronic Engineering, 2018
作者:  Mao SJ(毛淑娟);  Wang GL(王桂磊);  Xu J(许静);  Zhang D(张丹);  Luo X(罗雪)
收藏  |  浏览/下载:46/0  |  提交时间:2019/05/05
Impact of Ge pre-amorphization implantation on forming ultrathin TiGe x on both n-and p-Ge substrate 期刊论文
Japanese Journal of Applied Physics, 2018
作者:  Liu S(刘实);  Li JF(李俊峰);  Wang WW(王文武);  Chen DP(陈大鹏);  Zhao C(赵超)
收藏  |  浏览/下载:11/0  |  提交时间:2019/05/20
On the manifestation ofGe Pre-amorphization Implantation (PAI) in forming ultrathin TiSix for Ti direct contact on Si in sub-16/14 nm Complementary Metal-Oxide-Semiconductor (CMOS) technology nodes 期刊论文
ECS Journal of Solid State Science and Technology, 2017
作者:  Wang GL(王桂磊);  Li JF(李俊峰);  Zhao C(赵超);  Ye TC(叶甜春);  Chen DP(陈大鹏)
收藏  |  浏览/下载:43/0  |  提交时间:2018/06/08
Ultra-shallow junctions formed using microwave annealing 期刊论文
Applied Physics Letters, 2013
作者:  Hu S(胡晟);  Xu P(许鹏);  Fu CC(付超超);  Luo J(罗军)
收藏  |  浏览/下载:5/0  |  提交时间:2014/10/30
Mobility enhancement technology for scaling of CMOS devices: Overview and status 期刊论文
Journal of Electron Material, 2011
作者:  Song Y(宋毅)
收藏  |  浏览/下载:9/0  |  提交时间:2012/11/16
Finite-element study of strain field in strained-Si MOSFET 外文期刊
2009
作者:  Liu, HH;  Xu, QX;  Duan, XF
收藏  |  浏览/下载:17/0  |  提交时间:2010/11/26
Hole mobility enhancement of pMOSFETs with strain channel induced by ge pre-amorphization implantation for source/drain extension 外文期刊
2006
作者:  Xu, QX;  Duan, XF;  Qian, H;  Liu, HH;  Li, HO
收藏  |  浏览/下载:12/0  |  提交时间:2010/11/26


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