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Preparation method for flip chip full intermetallic compound interconnection welding point, involves providing upper part of second welding plate with welding layer, and providing inter-metallic compound between first plate and second plate. 专利
申请日期: 2015-01-01, 公开日期: 2015-06-17
作者:  HUANG M LIU Y MA H ZHAO N ZHONG Y H
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/09
Preparation of intermetallic compound thin film involves providing first metal substrate, subjecting first metal substrate to plating, sputtering, vapor deposition, or brazing with filler metal layer, and providing second metal substrate. 专利
申请日期: 2015-01-01, 公开日期: 2015-05-27
作者:  HUANG M MA H YANG F ZHANG Z ZHAO J
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/09
The growth behavior of intermetallic compound layer of Sn-Ag-Cu/Cu interface during soldering 会议论文
Proceeding of 2005 International Conference on Asian Green Electronics- Design for Manufacturability and Reliability, 2005AGEC, 2005-03-15
作者:  Yu, D.Q.;  Wang, J.H.;  Wang, L.
收藏  |  浏览/下载:3/0  |  提交时间:2020/01/02
Residual stress and wear characteristics of Ni3Al coating layer 期刊论文
7th International Conference onResidual Strsses (ICRS-7), 2005, 卷号: 490-491, 页码: 619-624
作者:  Murotani, T;  Wang, Z;  Ikenaga, A;  Hirose, Y
收藏  |  浏览/下载:4/0  |  提交时间:2020/01/02
The effect of temperature on microstructureu and mechanical behavior of the vacuum brazed joint of Ti-46.5Al-5Nb alloy and 42CrMo steel 期刊论文
5th Pacific Rim International Conference on Advanced Materials and Processing, 2005, 卷号: 475-479, 页码: 829-832
作者:  Liu, W;  Gao, Q;  Cong, W;  Guo, JT
收藏  |  浏览/下载:4/0  |  提交时间:2020/01/02
Microstructure and interface reaction between Sn-3.5Ag solder and electroplated Ni layer on Cu substrate during high temperature exposure 会议论文
International Conference on the Business of Electronic Product Reliability and Liability, Shanghai, PEOPLES R CHINA, 2004-04-27
作者:  Duan, LL;  Yu, DQ;  Han, SQ;  Zhao, J;  Wang, L
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/02
The growth behavior of intermetallic compound layer of Sn-Ag-Cu/Cu interface during soldering 会议论文
International Conference on Asian Green Electronics - Design for Manufacturability and Reliability (2005 AGEC), Shanghai, PEOPLES R CHINA
作者:  Yu, DQ;  Wang, JH;  Wang, L
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/02
Microstructure and forming mechanism of diffusion brazing interface of TiAl alloy and 42CrMo 期刊论文
Hangkong Cailiao Xuebao/Journal of Aeronautical Materials, 2003, 卷号: 23, 页码: 51-54
作者:  Gao Q.;  Guo J.-T.;  Liu W.;  Zhang J.-S.
收藏  |  浏览/下载:3/0  |  提交时间:2020/01/02
The stability of a protective Al2O3 layer on a niobium ion-implanted gamma-TiAl intermetallic compound 期刊论文
JOURNAL OF MATERIALS SCIENCE LETTERS, 2000, 卷号: 19, 页码: 1839-1841
作者:  Lei, MK;  Zhu, XP;  Tang, ZL;  Wang, FH
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/02


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