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The Statistics of Set Time of Oxide-based Resistive Switching Memory 会议论文
作者:  Zhang MY(张美芸);  Wang GM(王国明);  Yu ZA(余兆安);  Li Y(李阳);  Xu DL(许定林)
收藏  |  浏览/下载:21/0  |  提交时间:2017/05/19
Compact Analytical Models for the SET and RESET Switching Statistics of RRAM Inspired in the Cell-Based Percolation Model of Gate Dielectric Breakdown 会议论文
作者:  Long SB(龙世兵);  Huo ZL(霍宗亮);  Liu M(刘明)
收藏  |  浏览/下载:9/0  |  提交时间:2014/10/22
Compact Analytical Models for the SET and RESET Switching Statistics of RRAM Inspired in the Cell-Based Percolation Model 会议论文
作者:  Liu M(刘明);  Long SB(龙世兵)
收藏  |  浏览/下载:9/0  |  提交时间:2014/10/22


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