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A convenient method to determine the bulk modulus of nanowires and itstemperature dependence based on X-ray diffraction measurement 期刊论文
solid state communications, 2010, 期号: 150
Xin Feng Li,; Guang Tao Fei; Wen Fei Zhou; Li De Zhang
收藏  |  浏览/下载:10/0  |  提交时间:2011/09/20
In Situ X-ray Diffraction Study on the Orientation-Dependent Thermal Expansion of Cu Nanowires 期刊论文
j. phys. chem.c, 2009, 期号: 22
Wen Fei Zhou; Guang Tao Fei; Xin Feng Li; Shao Hui Xu; Li Chen; Bing Wu
收藏  |  浏览/下载:30/0  |  提交时间:2010/02/05


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