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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 学科主题：Physics, Applied     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Fabrication of Ni-P coating film on diamond/Al composite and its soldering reliability 期刊论文 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 卷号: 29, 期号: 10, 页码: 8371-8379 作者:  Shi, QY;  Liu, ZQ;  Wu, D;  Zhang, H;  Ni, DR 收藏  |  浏览/下载：30/0  |  提交时间：2018/06/05 Al/diamond Composites  Thermal-conductivity  Coated Diamond  Heat Sinks  Densification  Microstructure  Mechanisms  Strength  Surface  Growth   Failure behavior of flip chip solder joint under coupling condition of thermal cycling and electrical current 期刊论文 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 卷号: 29, 期号: 6, 页码: 5025-5033 作者:  Zhu, QS;  Gao, F;  Ma, HC;  Liu, ZQ;  Guo, JD 收藏  |  浏览/下载：20/0  |  提交时间：2018/06/05 Stress-relaxation  Void Formation  Electromigration  Reliability  Sn  Interconnections  Thermomigration  Metallization  Mechanisms  Diffusion   Asymmetric resistive switching behaviour in a Au/a-C:Co/Au planar structure 期刊论文 MICROELECTRONICS RELIABILITY, 2018, 卷号: 87, 页码: 52, 56 作者:  Zhang, D.;  Li, T. R.;  Zhou, J. W.;  Jiang, Y. C.;  Ren, B. 收藏  |  浏览/下载：16/0  |  提交时间：2018/12/28 Asymmetric resistive switching  FIBJ  Amorphous carbon  Micro-gap  SCLC theory   Failure Mechanisms of SAC/Fe-Ni Solder Joints During Thermal Cycling 期刊论文 JOURNAL OF ELECTRONIC MATERIALS, 2017, 卷号: 46, 期号: 8, 页码: 5338-5348 Gao, Li-Yin; Liu, Zhi-Quan; Li, Cai-Fu 收藏  |  浏览/下载：34/0  |  提交时间：2017/08/17 Fe-Ni under bump metallization (UBM)  thermal cycling  microstructural evolution  lifetime  recrystallization  electron backscatter diffraction (EBSD)   Corrosion behavior of Sn-3.0Ag-0.5Cu lead-free solder joints 期刊论文 MICROELECTRONICS RELIABILITY, 2017, 卷号: 73, 页码: 69-75 Wang, Mingna; Wang, Jianqiu; Ke, Wei 收藏  |  浏览/下载：32/0  |  提交时间：2017/08/17 Lead-free solder joint  Corrosion  Microstructure  Solidification cracks   A superior interfacial reliability of Fe-Ni UBM during high temperature storage 期刊论文 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2017, 卷号: 28, 期号: 12, 页码: 8537-8545 Gao, Li-Yin; Li, Cai-Fu; Wan, Peng; Liu, Zhi-Quan 收藏  |  浏览/下载：22/0  |  提交时间：2017/08/17 The reliability of copper pillar under the coupling of thermal cycling and electric current stressing 期刊论文 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 卷号: 27, 期号: 9, 页码: 9748-9754 Ma, HC; Guo, JD; Chen, JQ; Wu, D; Liu, ZQ; Zhu, QS; Zhang, L; Guo, HY 收藏  |  浏览/下载：22/0  |  提交时间：2016/12/28