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浏览/检索结果: 共6条，第1-6条 帮助 限定条件 学科主题：半导体器件     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Carrier leakage effect on efficiency droop in InGaN/GaN light-emitting diodes 期刊论文 modern physics letters b, 2016, 卷号: 20, 页码: 1650221 Yang Huang; Zhiqiang Liu; Xiaoyan Yi; Yao Guo; Shaoteng Wu; Guodong Yuan; Junxi Wang; Guohong Wang; Jinmin Li 收藏  |  浏览/下载：16/0  |  提交时间：2017/03/16 High Quantum Efficiency and Low Droop of 400-nm InGaN Near-Ultraviolet Light-Emitting Diodes Through Suppressed Leakage Current 期刊论文 ieee journal of quantum electronics, 2015, 卷号: 51, 期号: 9, 页码: 3300605 Panpan Li; Hongjian Li; Liancheng Wang; Xiaoyan Yi; Guohong Wang 收藏  |  浏览/下载：15/0  |  提交时间：2016/04/15 Ti Schottky barrier diodes on n-type 6H-SiC 会议论文 6th international conference on solid-state and integrated-circuit technology, shanghai, peoples r china, oct 22-25, 2001 作者:  Yu F 收藏  |  浏览/下载：13/0  |  提交时间：2010/10/29 SEMICONDUCTOR   Temperature-stimulated abnormal annealing of neutron-induced damage in high-resistivity silicon detectors 期刊论文 nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1997, 卷号: 385, 期号: 2, 页码: 321-329 Li Z; Li CJ; Verbitskaya E; Eremin V 收藏  |  浏览/下载：16/0  |  提交时间：2010/11/17 CHARGES N-EFF  RADIATION-DAMAGE  SPECTROSCOPY   Investigation on the N-eff reverse annealing effect using TSC/I-DLTS: Relationship between neutron induced microscopic defects and silicon detector electrical degradations 期刊论文 nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1996, 卷号: 377, 期号: 0, 页码: 265-275 Li Z; Li CJ; Eremin V; Verbitskaya E 收藏  |  浏览/下载：12/0  |  提交时间：2010/11/17 RADIATION-DAMAGE  RESISTIVITY   Microscopic analysis of defects in a high resistivity silicon detector irradiated to 1.7x10(15)n/cm(2) 期刊论文 ieee transactions on nuclear science, 1996, 卷号: 43, 期号: 3, 页码: 1590-1598 Li Z; Ghislotti G; Kraner HW; Li CJ; Nielsen B; Feick H; Lindstroem G 收藏  |  浏览/下载：15/0  |  提交时间：2010/11/17 RADIATION-DAMAGE  JUNCTION