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HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ION-BEAM INDUCED ANNEALING OF MEV AS+ ION-IMPLANTED SILICON 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 卷号: 59, 页码: 434
ZHANG, BX; WANG, ZL; QI, L; ZHANG, PJ; ZHENG, JG; WANG, LC; DU, AY
收藏  |  浏览/下载:9/0  |  提交时间:2013/09/17
SPUTTERING ANGULAR-DISTRIBUTIONS OF INDIVIDUAL ELEMENTS FOR LOW-ENERGY AR ION IRRADIATION OF PTCU ALLOY 期刊论文
Chinese Physics Letters, 1991, 卷号: 8, 期号: 1, 页码: 44-47
L. P. Zheng; R. S. Li; M. Y. Li; W. Z. Shen; J. Y. Lin; Z. Y. Zou
收藏  |  浏览/下载:10/0  |  提交时间:2012/04/14
HIGH-RESOLUTION ELECTRON-MICROSCOPY ANALYSIS OF ION-BEAM INDUCED ANNEALING OF MEV AS+ ION-IMPLANTED SILICON 其他
1991-01-01
ZHANG, BX; WANG, ZL; QI, L; ZHANG, PJ; ZHENG, JG; WANG, LC; DU, AY
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/16


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