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浏览/检索结果: 共5条，第1-5条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Reactive sputter deposition of WO3 films by using two deposition methods 期刊论文 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2019, 卷号: 37, 期号: 3, 页码: 6 作者:  Yasuda, Yoji;  Hoshi, Yoichi;  Kobayashi, Shin-ichi;  Uchida, Takayuki;  Sawada, Yutaka 收藏  |  浏览/下载：15/0  |  提交时间：2021/02/02 Effect of negative bias on the composition and structure of the tungsten oxide thin films deposited by magnetron sputtering 期刊论文 APPLIED SURFACE SCIENCE, 2015, 卷号: 359, 页码: 521-525 Wang, Meihan; Lei, Hao; Wen, Jiaxing; Long, Haibo; Sawada, Yutaka; Hoshi, Yoichi; Uchida, Takayuki; Hou, Zhaoxia 收藏  |  浏览/下载：14/0  |  提交时间：2016/04/21 Tungsten oxide thin films  Magnetron sputtering  Negative bias voltage (V-b)  Structure  Composition   Low-Resistivity Indium-Tin-Oxide Transparent Conducting Films: Dependence of Carrier Electron Concentration on Tin Concentration 期刊论文 PROCEEDINGS OF THE 2015 INTERNATIONAL CONFERENCE ON MATERIAL SCIENCE AND APPLICATIONS (ICMSA 2015), 2015, 卷号: 3, 页码: 719-722 Sawada, Yutaka; Seki, Shigeyuki; Uchida, Takayuki; Hoshi, Yoichi; Wang, Mei-Han; Lei, Hao; Sun, Li-Xian 收藏  |  浏览/下载：17/0  |  提交时间：2016/04/21 ITO  Tin-doped In2O3  Spray chemical vapor deposition   Thermal crystallization kinetic and electrical properties of partly crystallized amorphous indium oxide thin films sputtering deposited in the presence or the absence of water vapor 期刊论文 journal of thermal analysis and calorimetry, 2013, 卷号: 111, 期号: 2, 页码: 1457-1461 作者:  Wang, Meihan;  Lei, Hao;  Seki, Yoshiyuki;  Seki, Shigeyuki;  Sawada, Yutaka 收藏  |  浏览/下载：18/0  |  提交时间：2014/09/11 Partly crystallized amorphous IO film  Water vapor  Thermal crystallization kinetic  Electrical properties   Thermal change of organic light-emitting ALQ3 thin films 期刊论文 journal of thermal analysis and calorimetry, 2010, 卷号: 99, 期号: 1, 页码: 117-122 作者:  Wang, Mei-Han;  Konya, Takayuki;  Yahata, Masahiro;  Sawada, Yutaka;  Kishi, Akira 收藏  |  浏览/下载：14/0  |  提交时间：2015/11/12 Alq3 thin film  Thermal crystallization  High-temperature X-ray diffraction  Thermal change  X-ray reflectometry