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CORC

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Spatial Modulation-Assisted Scanning White-Light Interferometry for Noise Suppression 期刊论文
IEEE PHOTONICS TECHNOLOGY LETTERS, 2018, 卷号: 30, 期号: 4, 页码: 379-382
作者:  Deng, Qinyuan;  Liu, Junbo;  Tang, Yan;  Zhou, Yi;  Yang, Yong
收藏  |  浏览/下载：34/0  |  提交时间：2019/08/23
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy 期刊论文
OPTICS EXPRESS, 2018, 卷号: 26, 期号: 3, 页码: 2944-2953
作者:  Xie, Zhongye;  Tang, Yan;  Zhou, Yi;  Deng, Qinyuan
收藏  |  浏览/下载：19/0  |  提交时间：2019/08/23
Spatial modulation assisted scanning white-light interferometry for noise suppression 期刊论文
IEEE Photonics Technology Letters, 2017
作者:  Deng, Qinyuan;  Liu, Junbo;  Tang, Yan;  Zhou, Yi;  Yang, Yong
收藏  |  浏览/下载：21/0  |  提交时间：2018/11/20
Fabrication of micro-optics elements with arbitrary surface profiles based on one-step maskless grayscale lithography 期刊论文
Micromachines, 2017, 卷号: 8, 期号: 10, 页码: 314
作者:  Deng, Qinyuan;  Yang, Yong
收藏  |  浏览/下载：35/0  |  提交时间：2018/11/20
Characterization of micro structure through hybrid interference and phase determination in broadband light interferometry 期刊论文
Applied Optics, 2017, 卷号: 56, 期号: 8, 页码: 2301-2306
作者:  Zhou, Yi;  Tang, Yan;  Zhu, Jiangping;  Deng, Qinyuan;  Yang, Yong
收藏  |  浏览/下载：45/0  |  提交时间：2018/11/20
Contrast enhancement of microsphere-assisted super-resolution imaging in dark-field microscopy 期刊论文
APPLIED PHYSICS EXPRESS, 2017, 卷号: 10, 期号: 8
作者:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Zhao, Lixin;  Hu, Song
收藏  |  浏览/下载：22/0  |  提交时间：2018/11/20
Dimensional metrology of smooth micro structures utilizing the spatial modulation of white-light interference fringes 期刊论文
Optics and Laser Technology, 2017, 卷号: 93, 页码: 187-193
作者:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Liu, Junbo;  Wang, Jian
收藏  |  浏览/下载：53/0  |  提交时间：2018/11/20
Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry 会议论文
作者:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Zhao, Lixin;  Hu, Song
收藏  |  浏览/下载：46/0  |  提交时间：2018/12/20
Topography measurement of micro structure by modulation-based method 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968505
作者:  Zhou, Yi;  Tang, Yan;  Liu, Junbo;  Deng, Qinyuan;  Cheng, Yiguang
收藏  |  浏览/下载：19/0  |  提交时间：2018/06/14
Thickness measurement of transparent film by white-light interferometry 期刊论文
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968506
作者:  Deng, Qinyuan;  Zhou, Yi;  Liu, Junbo;  Yao, Jingwei;  Hu, Song
收藏  |  浏览/下载：24/0  |  提交时间：2018/06/14

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