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浏览/检索结果: 共1条，第1-1条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文 MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China Wang X.-J.; Li X.-Z.; Su S.-C. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.