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浏览/检索结果: 共5条，第1-5条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2013, 卷号: 21, 期号: [db:dc_citation_issue], 页码: 614-623 作者:  Liang, Feng;  Zhang, Luwen;  Lei, Shaochong;  Zhang, Guohe;  Gao, Kaile 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/10 single-input change (SIC)  test pattern generator (TPG)  low power  Built-in self-test (BIST)   An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation 期刊论文 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2011, 卷号: 27, 期号: [db:dc_citation_issue], 页码: 477-484 作者:  Sun, Haijun;  Zeng, Yongjia;  Li, Pu;  Lei, Shaochong;  Shao, Zhibiao 收藏  |  浏览/下载：1/0  |  提交时间：2019/12/10 Test pattern generator (TPG)  Low power  Single input change (SIC) sequence  Seed  Fault coverage  Built-in self-test (BIST)   A Low Power Test Pattern Generator for BIST 期刊论文 IEICE TRANSACTIONS ON ELECTRONICS, 2010, 卷号: E93C, 期号: 5, 页码: 696-702 作者:  Lei, Shaochong;  Liang, Feng;  Liu, Zeye;  Wang, Xiaoying;  Wang, Zhen 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/18 single input change (SIC)  fault coverage  power  built-in self-test (BIST)   A class of SIC circuits: Theory and application in BIST design 期刊论文 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2008, 卷号: 55, 期号: 2, 页码: 161-165 作者:  Shaochong, Lei;  Xueyan, Hou;  Zhibiao, Shao;  Feng, Liang 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/18 property  seed  single input change (SIC) sequence  built-in self-test (BIST)   A single input change test pattern generator for sequential circuits 期刊论文 IEICE TRANSACTIONS ON ELECTRONICS, 2008, 卷号: E91C, 期号: 8, 页码: 1365-1370 作者:  Liang, Feng;  Lei, ShaoChong;  Shao, ZhiBiao 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/18 sequential circuit  seed  single input change (SIC) sequence  built-in self-test (BIST)