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CORC

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Defect Analysis and Parallel Testing or 3D Hybrid CMOS-Memristor Memory 期刊论文
IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, 2021, 卷号: 9, 期号: 2, 页码: 745-758
作者:  Liu, Peng;  You, Zhiqiang;  Wu, Jigang;  Elimu, Michael;  Wang, Weizheng
收藏  |  浏览/下载：32/0  |  提交时间：2021/12/01
Simulation and field testing of multiple vehicles collision avoidance algorithms 期刊论文
IEEE-CAA JOURNAL OF AUTOMATICA SINICA, 2020, 卷号: 7, 期号: 4, 页码: 1045-1063
作者:  Zu, Chaoyue;  Yang, Chao;  Wang, Jian;  Gao, Wenbin;  Cao, Dongpu
收藏  |  浏览/下载：17/0  |  提交时间：2020/08/03
Simulation and Field Testing of Multiple Vehicles Collision Avoidance Algorithms 期刊论文
IEEE/CAA Journal of Automatica Sinica, 2020, 卷号: 7, 期号: 4, 页码: 1045-1063
作者:  Chaoyue Zu;  Chao Yang;  Jian Wang;  Wenbin Gao;  Dongpu Cao
收藏  |  浏览/下载：8/0  |  提交时间：2021/03/11
All-digital synchronous 2 x time-difference amplifier based on time register 期刊论文
ELECTRONICS LETTERS, 2017
Lyu, Yinxuan; Feng, Jianhua; Ye, Hongfei; Yu, Dunshan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03
The new high-speed switching study of ultra-short laser pulse technology 会议论文
8th international symposium on advanced optical manufacturing and testing technologies: optoelectronic materials and devices, aomatt 2016, suzhou, china, 2016-04-26
作者:  Sun, Bo;  Gou, Yongsheng;  Wang, Dahui;  Liu, Baiyu;  Zhao, Xueqing
收藏  |  浏览/下载：32/0  |  提交时间：2016/12/20
An efficient small-delay faults simulator based on critical path tracing 期刊论文
International Journal of Circuit Theory and Applications, 2015, 卷号: Vol.43 No.8, 页码: 1015-1023
作者:  Liu, Tieqiao;  Kuang, Jishun;  Cai, Shuo;  You, Zhiqiang
收藏  |  浏览/下载：6/0  |  提交时间：2019/12/31
快速空间目标的光电跟踪及控制系统的研究与实现 学位论文
博士, 北京: 中国科学院研究生院（云南天文台）, 2014
作者:  黄涛
收藏  |  浏览/下载：79/0  |  提交时间：2016/04/12
THE INVESTIGATION OF 3D EMBEDDED MICROCHANNEL NETWORKS FOR 3D IC COOLING, VACUUM PACKAGING AND THZ PASSIVE DEVICE APPLICATIONS 其他
2012-01-01
Miao, Min; Zhang, Jing; Zhang, Yang; Han, Bo; Jin, Yufeng
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/16
Path Delay Test generation Toward Activation of worst Case Coupling Effects 期刊论文
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
作者:  minjin, zhang;  Huawei, Li;  Xiaowei,Li
收藏  |  浏览/下载：13/0  |  提交时间：2017/09/19
Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982
作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei
收藏  |  浏览/下载：15/0  |  提交时间：2019/12/16

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