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浏览/检索结果: 共2条，第1-2条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Comparison between double crystals x-ray diffraction micro-raman measurement on composition determination of high ge content si1_xgex layer epitaxied on si substrate 期刊论文 Journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654 作者:  Zhao, Lei;  Zuo, Yuhua;  Cheng, Buwen;  Yu, Jinzhong;  Wang, Qiming 收藏  |  浏览/下载：16/0  |  提交时间：2019/05/12 Si1_xgex  Ge content  Composition determination  Double crystals x-ray diffraction (dcxrd)  Micro-raman measurement   Comparison between double crystals X-ray diffraction micro-Raman measurement on composition determination of high Ge content Si1_xGex layer epitaxied on Si substrate 期刊论文 journal of materials science & technology, 2006, 卷号: 22, 期号: 5, 页码: 651-654 Zhao L (Zhao Lei); Zuo YH (Zuo Yuhua); Cheng BW (Cheng Buwen); Yu JZ (Yu Jinzhong); Wang QM (Wang Qiming) 收藏  |  浏览/下载：37/0  |  提交时间：2010/04/11 Si1_xGex  Ge content  composition determination  double crystals X-ray diffraction (DCXRD)  micro-Raman measurement  BAND-GAP  HETEROSTRUCTURES  SUPERLATTICES  ALLOYS  RELAXATION  SCATTERING  THICKNESS  STRAIN