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New thermal optimization scheme of power module in solid-state amplifier 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2019, 卷号: 30, 期号: 4, 页码: 7
作者:  Sun, Lie-Peng;  Yuan, Zhen-Yu;  Zhang, Cheng;  Xu, Xian-Bo;  Miao, Jun-Gang
收藏  |  浏览/下载：50/0  |  提交时间：2019/11/10
Ruggedness Characterization of Bonding Wire Arrays in LDMOSFET-Based Power Amplifiers 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 页码: 1032-1041
作者:  Lin, Liang;  Hua, Yu-Jie;  Zhou, Liang;  Wu, Qi;  Mao, Junfa
收藏  |  浏览/下载：4/0  |  提交时间：2019/12/30
A High-Voltage (> 600 V) N-Island LDMOS With Step-Doped Drift Region in Partial SOI Technology 期刊论文
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016
Hu, Yue; Wang, Hao; Du, Caixia; Ma, Miaomiao; Chan, Mansun; He, Jin; Wang, Gaofeng
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device 其他
2016-01-01
Lai, Ciou Jhong; Sheu, Gene; Chien, Ting Yao; Wu, Chieh Chih; Lee, Tzu Chieh; Deivasigamani, Ravi; Wu, Ching Yuan; Chandrashekhar; Yang, Shao Ming
收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 期刊论文
日本应用物理学杂志, 2014
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
High temperature behavior of multi-region direct current current-voltage spectroscopy and relationship with shallow-trench-isolation-based high-voltage laterally diffused metal-oxide-semiconductor field-effect-transistors reliability 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
开关电源电路设计及其高压功率器件研制 学位论文
2014, 2014
江凌峰
收藏  |  浏览/下载：2/0  |  提交时间：2016/01/12
Study on silicon window polarity of partial-SOI LDMOS power devices 期刊论文
Proceedings of the 5th Asia Symposium on Quality Electronic Design, ASQED 2013, 2013
作者:  Du, Caixia;  Zhong, Shengju;  Hu, Yue;  Wang, Hao;  Wang, Cheng
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/05
Investigation of Hot Carrier Degradation in Shallow-Trench-Isolation-Based High-Voltage Laterally Diffused Metal-Oxide-Semiconductor Field-Effect Transistors by a Novel Direct Current Current-Voltage Technique 期刊论文
日本应用物理学杂志, 2012
He, Yandong; Zhang, Ganggang
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
An analytical model for the drain-source breakdown voltage of RF LDMOS power transistors with a Faraday shield 期刊论文
半导体学报(英文版), 2012, 卷号: 第4期, 页码: P32-37
作者:  Zhang Wenmin1;  * Zhang Wei1;  Fu Jun2;  Wang Yudong2
收藏  |  浏览/下载：6/0  |  提交时间：2019/11/26

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