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长春光学精密机械与物... [1]
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会议论文 [1]
发表日期
2007 [1]
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Super-resolved imaging system with oversampling technology (EI CONFERENCE)
会议论文
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
Zhang X.
;
Liu Y.
;
Zhang J.-P.
;
Wang L.-J.
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提交时间:2013/03/25
It has been a significant issue in the imaging filed to provide the highest possible resolution of an electro-optical imaging system(E-O imaging system). CCD arrays are inherently undersampled and spatial frequency above Nyquist frequency is distorted so as to create ambiguity and Moire patterns for targets imaged by E-O system.. As to this drawback
a system-design project is introduced and discussed in the paper. It's well known that many image quality metrics are linked to MTF. However
CCDs don't satisfy MTF condition
namely
the shift-invariant property
so MTF synthesis can't appraise the whole system simply by the MTF product of the few sub-system ones in E-O imaging system. Then it is depicted how to solve this problem in the following. Finally the analyses and comparisons of the imaging performance parameters with and without super-resolved technologies are shown.
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