CORC

浏览/检索结果: 共1条,第1-1条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
3D KMC Reliability Simulation of Nano-Scaled HKMG nMOSFETs with Multiple Traps Coupling 其他
2015-01-01
Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载:3/0  |  提交时间:2017/12/03


©版权所有 ©2017 CSpace - Powered by CSpace