QQ客服 官方微博 反馈留言

浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：1998    内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Modification of defects induced by nuclear collisions in Fe and Ni in electronic stopping power regime 会议论文 作者:  Wang, ZG;  Dufour, C;  Jin, YF;  Hou, MD;  Jin, GM 收藏  |  浏览/下载：13/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  defect production and annealing  damage efficiency  recombination cross section   Modification of defects induced by nuclear collisions in Fe and Ni in electronic stopping power regime 会议论文 作者:  Wang, ZG;  Dufour, C;  Jin, YF;  Hou, MD;  Jin, GM 收藏  |  浏览/下载：17/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  defect production and annealing  damage efficiency  recombination cross section   Defect production and annealing induced by electronic energy loss in pure metal 会议论文 作者:  Wang, ZG;  Dufour, C;  Hou, MD;  Jin, GM;  Jin, YF 收藏  |  浏览/下载：13/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  stochastic thermal defect production and annealing  damage efficiency   Defect production and annealing induced by electronic energy loss in pure metal 会议论文 作者:  Wang, ZG;  Dufour, C;  Hou, MD;  Jin, GM;  Jin, YF 收藏  |  浏览/下载：12/0  |  提交时间：2018/08/20 electronic energy loss  thermal spike  vacancy and interstitial  stochastic thermal defect production and annealing  damage efficiency   Room-temperature visible photoluminescence from C clusters embedded in thin SiO2 films 会议论文 3rd International Conference on Thin Film Physics and Applications, Shanghai, China, April 15, 1997 - April 15, 1997 作者:  Wang, Yinyue;  Yang, Yinhu;  Guo, Yongping;  Gan, Runjin;  Wang, Jizheng 收藏  |  浏览/下载：2/0  |  提交时间：2017/01/20 Composite films  Composite materials  Light emission  Luminescence  Photoluminescence  Silicon compounds  Thick films  Thin film devices  Thin films  Annealing temperatures  Peak energies  Postannealing treatments  Quantum confinement effect  Room temperatures  Sample thicknesses  Sputtering techniques  Substrate temperatures  Xrd measurements