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The high-frequency tunnel capacitance overload phenomenon of semiconductor-insulator-semiconductor heterojunction caused by the ultra-thin interfacial layers 期刊论文
Kexue Tongbao/Chinese Science Bulletin, 2017, 卷号: 62, 页码: 3385-3391
作者:  Li, Yong[1];  Gao, Ming[2];  Wan, Yazhou[3];  Du, Huiwei[4];  Chen, Shumin[5]
收藏  |  浏览/下载:3/0  |  提交时间:2019/04/24
Questing and the application for silicon based ternary compound within ultra-thin layer of SIS intermediate region 期刊论文
APPLIED SURFACE SCIENCE, 2016, 卷号: 388, 页码: 57-63
作者:  Chen, Shumin[1];  Gao, Ming[2];  Wan, Yazhou[3];  Du, Huiwei[4];  Li, Yong[5]
收藏  |  浏览/下载:16/0  |  提交时间:2019/04/26


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