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浏览/检索结果: 共7条，第1-7条 帮助 限定条件 专题：光电技术研究所    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Spatial Modulation-Assisted Scanning White-Light Interferometry for Noise Suppression 期刊论文 IEEE PHOTONICS TECHNOLOGY LETTERS, 2018, 卷号: 30, 期号: 4, 页码: 379-382 作者:  Deng, Qinyuan;  Liu, Junbo;  Tang, Yan;  Zhou, Yi;  Yang, Yong 收藏  |  浏览/下载：34/0  |  提交时间：2019/08/23 Surface measurement  noise suppression  spatial modulation   Spatial modulation assisted scanning white-light interferometry for noise suppression 期刊论文 IEEE Photonics Technology Letters, 2017 作者:  Deng, Qinyuan;  Liu, Junbo;  Tang, Yan;  Zhou, Yi;  Yang, Yong 收藏  |  浏览/下载：21/0  |  提交时间：2018/11/20 Bandpass filters - Frequency domain analysis - Interferometry - Light sources - Scanning - Signal to noise ratio - Spurious signal noise - Surface measurement   Dimensional metrology of smooth micro structures utilizing the spatial modulation of white-light interference fringes 期刊论文 Optics and Laser Technology, 2017, 卷号: 93, 页码: 187-193 作者:  Zhou, Yi;  Tang, Yan;  Deng, Qinyuan;  Liu, Junbo;  Wang, Jian 收藏  |  浏览/下载：53/0  |  提交时间：2018/11/20 Frequency domain analysis - Interferometry - Microstructure - Phase measurement - System stability - Topography - Units of measurement   Topography measurement of micro structure by modulation-based method 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968505 作者:  Zhou, Yi;  Tang, Yan;  Liu, Junbo;  Deng, Qinyuan;  Cheng, Yiguang 收藏  |  浏览/下载：21/0  |  提交时间：2018/06/14 Interferometry  Light Sources  Manufacture  Materials Testing  Microstructure  Optical Devices  Pixels  Surface Measurement  Topography   Thickness measurement of transparent film by white-light interferometry 期刊论文 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968506 作者:  Deng, Qinyuan;  Zhou, Yi;  Liu, Junbo;  Yao, Jingwei;  Hu, Song 收藏  |  浏览/下载：24/0  |  提交时间：2018/06/14 Film Thickness  Manufacture  Materials Testing  Optical Devices  Optical Films  Reflection  Reflectometers  Structural Design  Thickness Gages  Thickness Measurement  Thin Films   Moire-Based Interferometry for Magnification Calibration of Bitelecentric Lens System 期刊论文 IEEE PHOTONICS JOURNAL, 2015, 卷号: 7, 期号: 6 作者:  Zhou, Yi;  Zhu, Jiangping;  Deng, Qinyuan;  Liu, Junbo;  Si, Xinchun 收藏  |  浏览/下载：24/0  |  提交时间：2016/02/03 Moire fringes  magnification  grating marks  phase analysis   Moiré-Based Interferometry for Magnification Calibration of Bitelecentric Lens System 期刊论文 IEEE Photonics Journal, 2015, 卷号: 7, 期号: 6, 页码: 3900311 作者:  Zhou, Yi;  Zhu, Jiangping;  Deng, Qinyuan;  Liu, Junbo;  Si, Xinchun 收藏  |  浏览/下载：10/0  |  提交时间：2016/11/23