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Influence of source and drain contacts on the properties of the indium-zinc oxide thin-film transistors based on anodic aluminum oxide gate d (EI收录) 会议论文
Journal of Applied Physics
作者:  Lan, Linfeng[1,2];  Xu, Miao[2];  Peng, Junbiao[1,2];  Xu, Hua[1];  Li, Min[1]
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