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Temporal Differential CMOS Image Sensor for Low-Light and High-Speed Applications 会议论文
international symposium on photoelectronic detection and imaging 2011 - advances in imaging detectors and applications, beijing, peoples r china, 2011
Guan N (Guan Ning); Zhang X (Zhang Xu); Dong Z (Dong Zan); Wang W (Wang Wei); Gui Y (Gui Yun); Han JQ (Han Jianqiang); Wang Y (Wang Yuan); Huang BJ (Huang Beiju); Chen HD (Chen Hongda)
收藏  |  浏览/下载:29/0  |  提交时间:2011/12/13
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/15


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