CORC

浏览/检索结果: 共2条,第1-2条 帮助

限定条件                    
已选(0)清除 条数/页:   排序方式:
A study of threshold variation compensated inverter-comparator for pulse circuits 会议论文
Proceedings of the Sixth IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, HDP'04, 2004-06-30
作者:  Cong, F[1];  Zhang, JY[2];  Yan, LM[3]
收藏  |  浏览/下载:2/0  |  提交时间:2019/05/10
A BS-BIST test circuit design for VAD-SOC 会议论文
Proceedings of the Sixth IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, HDP'04, 2004-06-30
作者:  Li, JF[1];  Zhang, JY[2];  Li, J[3];  Yan, LJ[4]
收藏  |  浏览/下载:1/0  |  提交时间:2019/05/10
VAD  SOC  DFT  BS  BIST  


©版权所有 ©2017 CSpace - Powered by CSpace