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The Statistics of Set Time of Oxide-based Resistive Switching Memory 会议论文
作者:  Zhang MY(张美芸);  Wang GM(王国明);  Yu ZA(余兆安);  Li Y(李阳);  Xu DL(许定林)
收藏  |  浏览/下载:21/0  |  提交时间:2017/05/19
INVESTIGATION OF THE FORMING PROGRAM FAILTURE IN ITIR STRUCTURE 会议论文
作者:  Liu M(刘明);  Long SB(龙世兵);  Wang GM(王国明);  Zhang MY(张美芸);  Liu HT(刘红涛)
收藏  |  浏览/下载:27/0  |  提交时间:2016/06/14
Justification and Monte Carlo simulation of microstructure evolution process of conductive filament in reset transition in Cu/HfO2/Pt RRAM 会议论文
作者:  Liu Q(刘琦);  Xu XX(许晓欣);  Zhang MY(张美芸);  Wang GM(王国明);  Liu M(刘明)
收藏  |  浏览/下载:10/0  |  提交时间:2016/06/14
Improving the Resistive Switching Reliability via controlling the resistance states of RRAM 会议论文
作者:  Liu M(刘明);  Liu Q(刘琦);  Lv HB(吕杭炳);  Xu DL(许定林);  Xu XX(许晓欣)
收藏  |  浏览/下载:9/0  |  提交时间:2016/06/14
Methodology for stability evaluation on the multi-level storages of oxide-based conductive bridge RAM (CBRAM) 会议论文
作者:  Zhang MY(张美芸);  Lv HB(吕杭炳);  Liu M(刘明);  Liu HT(刘红涛);  Xu XX(许晓欣)
收藏  |  浏览/下载:7/0  |  提交时间:2016/06/14
Study of the set statistical characteristics in the Cu/HfO2/Pt-based RRAM device 会议论文
Guilin, 2014-10-28
作者:  Sun PX(孙鹏霄);  Wang M(王明);  Liu HT(刘红涛);  Xu XX(许晓欣);  Li Y(李阳)
收藏  |  浏览/下载:6/0  |  提交时间:2016/10/14


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