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CORC

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MD3DOCKxb: An ultra-scalable CPU-MIC coordinated virtual screening framework 会议论文
作者:  Peng, Shaoliang;  Zhang, Xiaoyu;  Yang, Shunyun;  Su, Wenhe;  Zhang, Zhiqiang
收藏  |  浏览/下载：34/0  |  提交时间：2019/01/08
MAMBER: A CPU/MIC collaborated parallel framework for AMBER on Tianhe-2 supercomputer 会议论文
作者:  Peng, Shaoliang;  Zhang, Xiaoyu;  Lu, Yutong;  Liao, Xiangke;  Lu, Kai
收藏  |  浏览/下载：19/0  |  提交时间：2019/01/08
KRAS or BRAF Mutation in Ovarian Low-Grade Serous Carcinoma: An Analysis of 32 Chinese Patients 会议论文
作者:  Bi, Rui;  Xu, Yan;  Shan, Ling;  Xiao, Yaoxing;  Tu, Xiaoyu
收藏  |  浏览/下载：9/0  |  提交时间：2019/12/05
KRAS or BRAF Mutation in Ovarian Low-Grade Serous Carcinoma: An Analysis of 32 Chinese Patients 会议论文
作者:  Bi, Rui;  Xu, Yan;  Shan, Ling;  Xiao, Yaoxing;  Tu, Xiaoyu
收藏  |  浏览/下载：3/0  |  提交时间：2019/12/05
Research on corrosion mechanism of suspension insulator steel foot of direct current system and measures for corrosion inhibition 会议论文
作者:  Chen, He;  Yang, Yueguang;  Su, Guolei;  Wang, Xiaoqing;  Zhang, Hourong
收藏  |  浏览/下载：2/0  |  提交时间：2019/12/05
Arbitrary microwave signal generator based on an optoelectronic oscillator and time-domain processing 会议论文
368 Huanshi Dong Lu, Guangzhou, Guangdong, China, November 10, 2017 - November 13, 2017
作者:  Zi, Yuejiao;  Jiang, Yang;  Tian, Jing;  He, Yutong;  Xia, Yi
收藏  |  浏览/下载：9/0  |  提交时间：2020/01/02
Hydrogen peroxide-responsive peroxalate ester-linked PCL-PEG micelles as drug carrier 会议论文
JOURNAL OF CONTROLLED RELEASE, 2017-08-10
作者:  Liu, Chao;  Zhu, Xiaowei;  Duan, Jianwei;  Liang, Xiaoyu;  Li, Xuanling
收藏  |  浏览/下载：6/0  |  提交时间：2020/01/03
Arbitrary microwave signal generator based on an optoelectronic oscillator and time-domain processing 会议论文
Huanshi Dong (City Ring East) Road, Guangzhou, Uangdong, 510064, China, November 10, 2017 - November 13, 2017
作者:  Zi, Yuejiao;  Jiang, Yang;  Tian, Jing;  He, Yutong;  Xia, Yi
收藏  |  浏览/下载：3/0  |  提交时间：2020/01/05
A novel White-Light Interferometry using low differential-frequency heterodyne system 会议论文
Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium, Munich, GERMANY, 2017-01-01
作者:  Kong, Xinxin;  Xiangli, Bin;  Zhang, Wenxi;  Wu, Zhou;  Li, Yang
收藏  |  浏览/下载：8/0  |  提交时间：2019/12/30

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