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Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors 期刊论文
应用物理学快报, 2015
Guo, Yao; Wei, Xianlong; Shu, Jiapei; Liu, Bo; Yin, Jianbo; Guan, Changrong; Han, Yuxiang; Gao, Song; Chen, Qing
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