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Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography 期刊论文
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2009, 卷号: 42, 页码: 1068-1072
作者:  Ning, LN;  Hu, XB;  Huang WX(黄万霞);  Yuan QX(袁清习);  Wang, YM
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