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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2006    学科主题：半导体材料    内容类型：会议论文     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Light-induced changes in diphasic nanocrystalline silicon films and solar cells 会议论文 21st international conference on amorphous and nanocrystalline semiconductors, lisbon, portugal, sep 04-09, 2005 Hao, HY (Hao, Huiying); Liao, XB (Liao, Xianbo); Zeng, XB (Zeng, Xiangbo); Diao, HW (Diao, Hongwei); Xu, Y (Xu, Ying); Kong, GL (Kong, Guanglin) 收藏  |  浏览/下载：243/53  |  提交时间：2010/03/29 silicon   Terahertz pulse generation with LT-GaAs photoconductive antenna 会议论文 joint 31st international conference on infrared and millimeter waves/14th international conference on terahertz electronics, shanghai, peoples r china, sep 18-22, 2006 Cui, LJ (Cui, L. J.); Zeng, YP (Zeng, Y. P.); Zhao, GZ (Zhao, G. Z.) 收藏  |  浏览/下载：160/48  |  提交时间：2010/03/29 TEMPERATURE-GROWN GAAS  CARRIER DYNAMICS  EMISSION   Optical and structural properties of ZnO films grown on Si(100) substrates by MOCVD - art. no. 60290G 会议论文 20th congress of the international-commission-for-optics, changchun, peoples r china, aug 21-26, 2005 Shen, WJ; Duan, Y; Wang, J; Wang, QY; Zeng, YP 收藏  |  浏览/下载：95/18  |  提交时间：2010/03/29 ZnO  MOCVD  thermal annealing  photoluminescence  x-ray diffraction  atomic force microscopy  PULSED-LASER DEPOSITION  THIN-FILMS  PHOTOLUMINESCENCE  MECHANISMS  EPITAXY  CVD  SI   Heterojunction solar cells with n-type nanocrystalline silicon emitters on p-type c-Si wafers 会议论文 21st international conference on amorphous and nanocrystalline semiconductors, lisbon, portugal, sep 04-09, 2005 Xu Y (Xu Ying); Hu ZH (Hu Zhihua); Diao HW (Diao Hongwei); Cai Y (Cai Yi); Zhang SB (Zhang Shibin); Zeng XB (Zeng Xiangbo); Hao HY (Hao Huiying); Liao XB (Liao Xianbo); Fortunato E (Fortunato Elvira); Martins R (Martins Rodrigo) 收藏  |  浏览/下载：237/57  |  提交时间：2010/03/29 silicon   Morphological defects and uniformity issues of 4H-SiC homoepitaxial layers grown on off-oriented (0001)Si faces 会议论文 11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005 Sun, GS (Sun, G. S.); Liu, XF (Liu, X. F.); Gong, QC (Gong, Q. C.); Wang, L (Wang, L.); Zhao, WS (Zhao, W. S.); Li, JY (Li, J. Y.); Zeng, YP (Zeng, Y. P.); Li, JM (Li, J. M.) 收藏  |  浏览/下载：166/18  |  提交时间：2010/03/29 4H-SiC