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Microstructure and interface reaction between Sn-3.5Ag solder and electroplated Ni layer on Cu substrate during high temperature exposure 会议论文
International Conference on the Business of Electronic Product Reliability and Liability, Shanghai, PEOPLES R CHINA, 2004-04-27
作者:  Duan, LL;  Yu, DQ;  Han, SQ;  Zhao, J;  Wang, L
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/02
Design and structural optimization on no-centering drilling dynamometer 会议论文
3rd International Symposium on Instrumentation Science and Technology, Xian, PEOPLES R CHINA
作者:  Han, LL;  Sun, BY;  Qian, M;  Fu, FZ
收藏  |  浏览/下载:1/0  |  提交时间:2020/01/02


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