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Determination of bulk and interface density of states in metal oxide semiconductor thin-film transistors by using capacitance-voltage characteristics 期刊论文
2017, 卷号: 80, 期号: 1
作者:  Wei, Xixiong[1];  Deng, Wanling[1];  Fang, Jielin[1];  Ma, Xiaoyu[1];  Huang, Junkai[1]
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/10
Metal oxide semiconductor thin-film transistors: Device physics and compact modeling 期刊论文
2017, 页码: 69
作者:  Deng, Wanling[1];  Fang, Jielin[1];  Wei, Xixiong[1];  Yu, Fei[1]
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/17
Simulation of High-Gain Amplifier with Metal Oxide Thin-Film Transistors 会议论文
Shenzhen, China, June 6, 2018 - June 8, 2018
作者:  Zhou, Zheng[1];  Zhuang, Feng[1];  Li, Na[1];  Deng, Wanling[1]
收藏  |  浏览/下载:0/0  |  提交时间:2019/12/23


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