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浏览/检索结果: 共8条，第1-8条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Analyzing the Spatial Scaling Bias of Rice Leaf Area Index From Hyperspectral Data Using Wavelet-Fractal Technique 其他 2015-01-01 Jiang, Jiale; Liu, Xiangnan; Liu, Chuanhao; Wu, Ling; Xia, Xiaopeng; Liu, Meiling; Du, Zhihong 收藏  |  浏览/下载：11/0  |  提交时间：2017/12/04 Hyperion data  leaf area index (LAI)  nonlinearity  scaling bias  spatial heterogeneity  wavelet-fractal technique  RADIATIVE-TRANSFER MODEL  REMOTE-SENSING DATA  VEGETATION INDEX  INVERSION  LAI  CHLOROPHYLL  REFLECTANCE  VALIDATION  IMAGERY  HETEROGENEITY   Impact of Temporal Transistor Variations on Circuit Reliability 其他 2015-01-01 Wang, Runsheng; Cao, Yu 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 circuit reliability  temporal variation  bias temperature instability (BTI)  random telegraph noise (RTN)   Duty Cycle Shift under Static/Dynamic Aging in 28nm HK-MG Technology 其他 2015-01-01 Sutaria, Ketul B.; Ren, Pengpeng; Mohanty, Abinash; Feng, Xixiang; Wang, Runsheng; Huang, Ru; Cao, Yu 收藏  |  浏览/下载：7/0  |  提交时间：2017/12/03 Aging  NBTI  PBTI  Duty Cycle Shift  BTI   Statistical Assessment Methodology for the Design and Optimization of Cross-Point RRAM Arrays 其他 2014-01-01 Li, Haitong; Jiang, Zizhen; Huang, Peng; Chen, Hong-Yu; Chen, Bing; Liu, Rui; Chen, Zhe; Zhang, Feifei; Liu, Lifeng; Gao, Bin; Liu, Xiaoyan; Yu, Shimeng; Wong, H.S. Philip; Kang, Jinfeng 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 Resistive random access memory (RRAM)  variation  cross-point array  statistical assessment  optimization   HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors 其他 2011-01-01 Huang, Ru; Wang, Runsheng; Liu, Changze; Zhang, Liangliang; Zhuge, Jing; Tao, Yu; Zou, Jibin; Liu, Yuchao; Wang, Yangyuan 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Impact of Structure Parameters and Operation Conditions on Performance of Nanoscale BioFET 其他 2010-01-01 Guan, Yan; Song, Yuanyuan; Zhang, Lining; He, Frank 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/16 Study of 20nm bulk FINFET by using 3D full band Monte Carlo method with effective potential quantum correction 其他 2010-01-01 Du, Gang; Zhang, Wei; Wang, Juncheng; Lu, Tiao; Zhang, Pingwen; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 Nonparametric inferences for additive models 其他 2005-01-01 Fan, JQ; Jiang, JC 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/12 additive models  backfitting algorithm  generalized likelihood ratio  local polynomial regression  Wilks phenomenon  CENTRAL-LIMIT-THEOREM  REGRESSION-MODELS  BACKFITTING ESTIMATORS  ASYMPTOTIC PROPERTIES  SERIES  TESTS  INTEGRATION  ALGORITHM  WAVELETS  DENSITY