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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 On the origin of frequency dependence of single-trap induced degradation in AC NBTI 其他 2015-01-01 Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Understanding of HCI degradation temperature dependence in SOI STI-pLDMOSFETs from MR-DCIV spectroscopy 其他 2015-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Understanding of HCI Degradation Temperature Dependence in SOI STI-pLDMOSFETs from MR-DCIV Spectroscopy 其他 2015-01-01 He, Yandong; Zhang, Ganggang; Zhang, Xin 收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03 LDMOS TRANSISTORS   On the Origin of Frequency Dependence of Single-Trap Induced Degradation in AC NBTI 其他 2015-01-01 Mao, Dongyuan; Guo, Shaofeng; Wang, Runsheng; Liu, Changze; Huang, Ru 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 New insights into AC RTN in scaled high-��/ metal-gate MOSFETs under digital circuit operations 其他 2012-01-01 Zou, Jibin; Wang, Runsheng; Gong, Nanbo; Huang, Ru; Xu, Xiaoqing; Ou, Jiaojiao; Liu, Changze; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Yu, Shaofeng; Ren, Pengpeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：7/0  |  提交时间：2015/11/13