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Electron irradiation-induced defects in InP pre-annealed at high temperature 会议论文
11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005
Zhao, YW (Zhao, Y. W.); Dong, ZY (Dong, Z. Y.); Deng, AH (Deng, A. H.)
收藏  |  浏览/下载:160/28  |  提交时间:2010/03/29
Improvement of the electrical property of semi-insulating InP by suppression of compensation defects 会议论文
17th international conference on indium phosphide and related materials, glasgow, scotland, may 08-12, 2005
Zhao, YW; Dong, ZY
收藏  |  浏览/下载:220/68  |  提交时间:2010/03/29
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/15


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