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Characterization of arsenic ultra-shallow junctions in silicon using photocarrier radiometry and spectroscopic ellipsometry 会议论文
International Journal of Thermophysics, 2012
作者:  Huang, Qiuping;  Li, Bincheng;  Gao, Weidong
收藏  |  浏览/下载:11/0  |  提交时间:2016/11/25
Analysis of enhanced photocarrier radiometry signals for ion-implanted and annealed silicon wafers 会议论文
International Journal of Thermophysics, 2012
作者:  Liu, Xianming;  Li, Bincheng;  Huang, Qiuping
收藏  |  浏览/下载:8/0  |  提交时间:2016/11/25
Accuracy improvement of multi-parameter estimation in combined photocarrier radiometry and free carrier absorption for characterization of silicon wafers 会议论文
International Journal of Thermophysics, 2012
作者:  Huang, Qiuping;  Li, Bincheng;  Ren, Shengdong
收藏  |  浏览/下载:14/0  |  提交时间:2016/11/25
Analysis of Enhanced Photocarrier Radiometry Signals for Ion-Implanted and Annealed Silicon Wafers 会议论文
Merida, MEXICO, NOV 27-DEC 01, 2011
作者:  Liu, Xianming[1,2];  Li, Bincheng[2];  Huang, Qiuping[2]
收藏  |  浏览/下载:1/0  |  提交时间:2019/11/29


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