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Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文
作者:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei
收藏  |  浏览/下载:34/0  |  提交时间:2018/12/20
Error analysis for aspheric surface testing system 会议论文
Proceedings of SPIE: International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications, 2013
作者:  Feng, Jie;  Deng, Chao;  Xing, Tingwen
收藏  |  浏览/下载:12/0  |  提交时间:2016/11/23
Determination the optical constants of hafnium oxide film by Spectroscopic ellipsometry with various dispersion models 会议论文
Proceedings of the SPIE - The International Society for Optical Engineering, 2010
作者:  Weidong Gao;  Yinhua Zhang;  Hongxiang Liu
收藏  |  浏览/下载:15/0  |  提交时间:2016/11/25
Joining of silicon carbide ceramic for optical application by reaction bonded technology 会议论文
Proceedings of the SPIE - The International Society for Optical Engineering, 2010
作者:  Aifang Zhang;  Yichao Chen;  Zhiqiang Chen;  Hong Liu;  Jingzhong Fang
收藏  |  浏览/下载:8/0  |  提交时间:2016/11/25


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