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Comparative analysis of absolute methods to test rotationally asymmetric surface deviation 会议论文
Proceedings of SPIE: Modeling Aspects in Optical Metrology IV, 2014, 2013
作者:  Song, Weihong;  Hou, Xi;  Wu, Fan;  Zhao, Wenchuan
收藏  |  浏览/下载:12/0  |  提交时间:2016/11/24
Comparative analysis of three-position measurement technology and multi-positions average measurement technology 会议论文
Proceedings of SPIE: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 2012
作者:  Yang, Peng;  Wu, Fan;  Hou, Xi
收藏  |  浏览/下载:8/0  |  提交时间:2016/11/24


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