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CORC

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High mobility compressive strained Si0.5Ge0.5 quantum well p-MOSFETs with higher-k/metal-gate 期刊论文
SOLID-STATE ELECTRONICS, 2011, 卷号: 62, 期号: 1, 页码: 185-188
Yu,W; Zhang,B; Zhao,QT; Hartmann,JM; Buca,D; Nichau,A; Luptak,R; Lopes,JMJ; Lenk,S; Luysberg,M; Bourdelle,KK; Wang,X; Mantl,S
收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10
New Thin-Film Multijunction Thermal Converter Based on P+ Polysilicon/Al Thermocouples 期刊论文
INTEGRATED FERROELECTRICS, 2011, 卷号: 128, 期号: 0, 页码: 8月13日
Han, JQ; Mao, CL; Zhong, Q; Li, Q; Yan, TH
收藏  |  浏览/下载：12/0  |  提交时间：2012/04/12
Temperature model for Ge2Sb2Te5 phase change memory in electrical memory device 期刊论文
SOLID-STATE ELECTRONICS, 2011, 卷号: 56, 期号: 1, 页码: 13-17
Cai,DL; Song,ZT; Chen,HP; Chen,XG
收藏  |  浏览/下载：14/0  |  提交时间：2012/04/10
Terahertz Semiconductor Quantum Well Photodetectors 期刊论文
ADVANCES IN INFRARED PHOTODETECTORS, 2011, 卷号: 84, 期号: 0, 页码: 195-242
Cao,JC; Liu,HC
收藏  |  浏览/下载：17/0  |  提交时间：2012/04/12
Effect of injection coupling strength on terahertz quantum-cascade lasers 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, 卷号: 26, 期号: 9, 页码: 95029
Li,H; Cao,JC
收藏  |  浏览/下载：8/0  |  提交时间：2012/04/12
Study of GaN epilayers growth on freestanding Si cantilevers 期刊论文
SOLID-STATE ELECTRONICS, 2010, 卷号: 54, 期号: 1, 页码: 4-7
Chen, J; Wang, X; Wu, AM; Zhang, B; Wang, X; Wu, YX; Zhu, JJ; Yang, H杨辉
收藏  |  浏览/下载：16/0  |  提交时间：2011/11/04
Study of GaN growth on ultra-thin Si membranes 期刊论文
SOLID-STATE ELECTRONICS, 2008, 卷号: 52, 期号: 6, 页码: 986-989
Wang, X; Wu, AM; Chen, J; Wang, X; Wu, YX; Zhu, JJ; Yang, H
收藏  |  浏览/下载：10/0  |  提交时间：2011/11/04
Effect of nanoclusters induced by Si implantation on total dose radiation response of a SOI wafer 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 1, 页码: 15015-15015
Wu,AM; Chen,J; Zhang,EX; Wang,X; Zhang,ZX
收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24
Effects of design parameters on the performance of terahertz quantum-cascade lasers 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 12, 页码: 125040-125040
Li,H; Cao,JC; Liu,HC
收藏  |  浏览/下载：11/0  |  提交时间：2011/12/17
A quick method for AlCu interconnect electromigration performance predicting and monitoring 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2006, 卷号: 21, 期号: 5, 页码: 633-637
Zhang,WJ; Yi,L; Tao,K; Ma,Y; Chang,PY; Mao,DL; Wu,J; Zou,SC
收藏  |  浏览/下载：10/0  |  提交时间：2012/03/24

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