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Improvement of the electrical property of semi-insulating InP by suppression of compensation defects 会议论文
17th international conference on indium phosphide and related materials, glasgow, scotland, may 08-12, 2005
Zhao, YW; Dong, ZY
收藏  |  浏览/下载:220/68  |  提交时间:2010/03/29
Low-frequency noise properties of GaN Schottky barriers deposited on intermediate temperature buffer layers 会议论文
1st international symposium on point defect and stoichiometry, sendai, japan, mar 20-22, 2003
Leung BH; Fong WK; Surya C; Lu LW; Ge WK
收藏  |  浏览/下载:22/0  |  提交时间:2010/10/29
Characterization of GaSb substrate wafers for MOCVD III-V antimonides 会议论文
7th international conference on defect recognition and image processing in semiconductors (drip-vii), templin, germany, sep 07-10, 1997
Peng RW; Ding YQ; Xu CM; Wang XG
收藏  |  浏览/下载:8/0  |  提交时间:2010/11/15
Observation of defects in GaN epilayers 会议论文
7th international conference on defect recognition and image processing in semiconductors (drip-vii), templin, germany, sep 07-10, 1997
Kang JY; Liu XL; Ogawa T
收藏  |  浏览/下载:10/0  |  提交时间:2010/11/15


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