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The effect of AlN growth time on the electrical properties of Al0.38Ga0.62N/AlN/GaN HEMT structures 期刊论文
journal of crystal growth, 2006, 卷号: 289, 期号: 2, 页码: 415-418
Wang CM; Wang XL; Hu GX; Wang JX; Xiao HL; Li JP
收藏  |  浏览/下载:44/0  |  提交时间:2010/04/11
A model for scattering due to interface roughness in finite quantum wells 期刊论文
semiconductor science and technology, 2005, 卷号: 20, 期号: 12, 页码: 1207-1212
作者:  Han XX
收藏  |  浏览/下载:58/0  |  提交时间:2010/04/11


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