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Depth distribution of the strain in the GaN layer with low-temperature AlN interlayer on Si(111) substrate studied by Rutherford backscattering/channeling 期刊论文
applied physics letters, 2004, 卷号: 85, 期号: 23, 页码: 5562-5564
Lu, Y; Cong, GW; Liu, XL; Lu, DC; Wang, ZG; Wu, MF
收藏  |  浏览/下载:20/0  |  提交时间:2010/03/17
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InAs/ln(0.52)Al(0.48)As quantum wire structure with the specific layer-ordering orientation on InP(001) 期刊论文
journal of crystal growth, 1999, 卷号: 197, 期号: 1-2, 页码: 95-98
作者:  Xu B
收藏  |  浏览/下载:49/0  |  提交时间:2010/08/12
Triclinic deformation and anisotropic strain relaxation of an InAs film on a GaAs(001) substrate measured by a series of symmetric double crystal X-ray diffraction 期刊论文
journal of crystal growth, 1998, 卷号: 191, 期号: 4, 页码: 627-630
Wang HM; Zeng YP; Zhou HW; Kong MY
收藏  |  浏览/下载:52/0  |  提交时间:2010/08/12


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